Previous Page  16 / 33 Next Page
Information
Show Menu
Previous Page 16 / 33 Next Page
Page Background

Page 84

conferenceseries

.com

Volume 6

Research & Reviews: Journal of Material Sciences

ISSN: 2321-6212

Ceramics 2018

May 14-15, 2018

May 14-15, 2018 | Rome, Italy

4

th

International Conference and Expo on

Ceramics and Composite Materials

First principles study electronic properties of (110) surface GaAs/GaN nanowires

Y. Chaib

1

, S. Benmokhtar

1

, M. Moutaabbid

1

, P.E. Hoggan

2

and

C. Robert-Goumet

2

1

University of Casablanca, Morocco

2

University Blaise Pascal, France

G

aAs one of III-V compound semiconductor nanowires that exhibit direct band gap has attracted much attention of

researchers due its potential application in the field of optoelectronic and microelectronic devices like photovoltaic cells,

photo detectors, modulators, filters, integrated circuits and light emitting diodes, it has been widely studied both experimentally

and theoretically, a fundamental understanding of its physical properties is still in demand of this novel material. During

the manufacture of its nanowires, their surfaces present anomalies which bound to Ga-free broken bonds which are easily

interacted with the environment and they oxidize for remedy this problem. We passivated these surfaces by the nitrogen for

saturating their surfaces. Motivated by the available literature on GaAs according to the crystalline plane (110), we carried

out calculations for structural and electronic properties of GaAs in its stable zinc-blende phase using full potential linearized

augmented plane wave method (FP-LPAW) designed within DFT. After that, we will passivate these nanowires by the nitrogen;

we study the nutrient effect on their physical properties (GaAs / GaN) by keeping the same theoretical model used previously

from a similar study that has been carried out on plane surfaces of GaAs showed that nitridation phenomena leads to the

deposition of a thin layer of GaN and confers passivated to the solid.

younesschaib@gmail.com

Res. Rev. J Mat. Sci. 2018, Volume 6

DOI: 10.4172/2321-6212-C1-015