Special Issue Article Open Access

45 Nm MIGFET-Based ADC Design with Dithering

Abstract

In this paper, a multiple independent gate FET (MIGFET)-based flash type analog to digital converter (ADC) has been designed with dithering facility to improve the accuracy of the ADC. The comparators in the ADC have been realized using MIGFETs. The analog input signal is given to one gate of the MIGFET and the noise signal is given to another gate of the MIGFET. The functionality is verified in 45 nm technology node using TSPICE. The ADC performance metric, mean square difference (MSD) between the input signal and the output signal is studied for various mean values of the noise signal to get the optimum noise level.

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