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conferenceseries.com
RRJOMS | Volume 5 | Issue 4 | July, 2017
July 27-29, 2017 Vancouver, Canada
10th International Conference on
Emerging Materials and Nanotechnology
Temperature-dependent hard X-ray excited optical luminescence to study the optical properties of
the ZnO microwires
Bi-Hsuan Lin
National Synchrotron Radiation Research Center, China
The advantages of using synchrotron radiation as the excitation source are that the tunableX-ray energy allows the preferential
excitation of the elements through the X-ray absorption edges, and a suitable time structure of the synchrotron can be
used to study the dynamics of luminescence of the materials. We developed the synchrotron based hard X-ray excited optical
luminescence (XEOL) and time-resolved X-ray excited optical luminescence (TR-XEOL) at the X-ray Nanoprobe (XNP) facility
at Taiwan Photon Source (TPS). In parallel to the construction of the XNP endstation, demonstrative XEOL experiments were
conducted by unfocused X-ray beam at Taiwan Light Source (TLS). The low temperature (4.2K) and temperature-dependent
XEOL with X-ray excited energy below, at and above the Zn K-edge (9.659 keV) were used to obtain the further information
of the optical mechanisms of the ZnO microwires. The temperature-dependent XEOL behavior of the ZnO microwires with
X-ray energy at 9.67 keV was shown in Figure 1. The free A excitons, donor bound excitons and their phonon replicas can be
seen unambiguously at low temperatures. The design of the XEOL and TR-XEOL at XNP and the demonstrative experimental
results will be reported.
Biography
Bi-Hsuan Lin has completed his PhD from Department of Photonics and Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu, Taiwan
and Post-doctoral studies from European Synchrotron Radiation Facility (ESRF) for one year. Currently, he works at National Synchrotron Radiation Research
Center as the Assistant Research Scientist. He is participating in the construction and commission of the X-ray nanoprobe beamlime at Taiwan Photo Source (TPS),
and is responsible for development of the XEOL and TR-XEOL.
Bi-Hsuan Lin, Res. Rev. J Mat. Sci. 2017
DOI: 10.4172/2321-6212-C1-002